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Zeitschrift für Physik A Hadrons&Nuclei | Vol.156, Issue.1 | | Pages 38-54

Bestimmung schwacher Absorptionen in dünnen dielektrischen Schichten

G. KoppelmannK. Krebs

Abstract

By a method specially developped for high accuracy, the weak absorption of thin dielectric films was measured and coefficients of absorption were evaluated. Results are stated for such substances as cryolithe, MgF₂, NaF, paraffin, ZnS and Sb₂O₃, which are used for the production of dielectric reflecting films.

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Bestimmung schwacher Absorptionen in dünnen dielektrischen Schichten

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Keywords

weak absorption dielectric reflecting films

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G. KoppelmannK. Krebs,.Bestimmung schwacher Absorptionen in dünnen dielektrischen Schichten. 156 (1),38-54.

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